UniFlash^TM has been developed by taking advantages of flash and EEPROM cells, eliminating inherent problems of existing NVM cells.

UniFlash^TM realizes the true unified flash memory by incorporating benefits of NAND into NOR-based flash architecture. It overcomes NORs' weaknesses, and enables fast write speed and lower cost per bit, while maintaining all the benefits of NOR flash - fast read and high reliability. UniFlash^TM is an ideal solution for both XIP program code and data storage without compromising any characteristics, for mobile handset and other embedded applications.

UniFlash^TM consists of full range technology including cell, device, process flow, and test technology. The UniFlash^TM product design can be manufactured by either own UniFlash^TM process flow or the existing NVM process flow, NOR or NAND, as it is, or slightly modifying the already setup process technology at target FAB.

UniFlash^TM is also an ideal solution for embedded flash-logic technology. Ease of process integration with logic, high reliability, high performance, low Vcc operation, low power consumption, small chip area and multiple type NVM supportability by a single technology basis are among the critical concerns for successful embedded NVM design projects, as semiconductor process technologies are becoming deeper below 0.18um. Meanwhile, most of the embedded NVM technologies have highly complex wafer process integration procedures, low performance, high power consumption and weak product reliability, becoming obstacles to popularizing of NVM embedded SoC designs. The innovative UniFlash^TM Technology provides easy process integration without re-engineering already established logic and analog technology, enabling seamless integration of essential IP blocks (including CPU/DSP, Logic and Mixed Signals) and NVM IP onto a high performance and low cost single die.

Thanks to its technological advantages, the UniFlash^TM technology overcomes the key technological limitations in existing flash technologies and realizes a highly scaleable NVM technology for sub 0.13um process. UniFlash^TM eliminates most of the reliability and performance issues of existing NVM technologies, such as over erase or bit line disturb, slow write of NOR and slow read of NAND. Some of the effects of this technological superiority includes smaller die size, higher performance, remarkably reduced test time and high yield and, as a result, better productivity.